Ion migration rate analysis device and analysis method applied
US11164735B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 15, 2018 |
| Grant date | Nov 2, 2021 |
| Priority date | — |
| Expiry date | Jan 17, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides an ion mobility analyzer apparatus and analysis method. The analyzer apparatus includes an ion source, two groups of parallel electrodes, a power supply unit and a detector. The drift region is formed between the two groups of parallel electrodes, and has an ion entrance connected to the ion source and an ion exit. Each group of parallel electrodes is located in a plane respectively, and the two planes are parallel to each other. The power supply unit is configured to apply direct current potentials on the two groups of parallel electrodes to form a direct current electric field that applies an opposing force on ions against the gas flow so that ions with different mobilities are trapped under the combined effect of the gas flow and the direct current electric field. The detector is connected to the ion exit to detect ions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.