Antenna testing
US11165160B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 29, 2019 |
| Grant date | Nov 2, 2021 |
| Priority date | — |
| Expiry date | May 29, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B7/18517
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for testing an antenna are described. In on embodiment, the antenna comprises: a memory; an antenna aperture with a plurality of electronically controlled radio frequency (RF) radiating antenna elements; a pattern generator, including one or more processors, to generate a plurality of patterns to apply to the antenna aperture during testing to cause the antenna to generate a beam in response to each pattern of the plurality of patterns while pointing at a satellite; a receiver to receive satellite signals from the satellite in response to generating beams with the aperture; a metric provider, including one or more processors, to generate one or more satellite signal metrics for the received satellite signals; and antenna parameter selector to select one or more parameters associated with beamforming based on the satellite signal metrics indicating antenna performance reached a predetermined level, wherein selection of the one or more parameters is for storage in the memory and used to generate a beam with the antenna aperture when performing data communication.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.