Compact freeform echelle spectrometer
US11169024B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Aug 16, 2018 |
| Grant date | Nov 9, 2021 |
| Priority date | — |
| Expiry date | Aug 16, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/2803
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An echelle spectrometer includes a slit opening for incoming light, a collimator which collimates a diverging beam of light generated through the slit, a reflective echelle grating which disperses the collimated light along a first dimension; a cross-disperser which disperses at least a portion of the collimated light in a second dimension orthogonal to the first dimension to create a two-dimensional spectral field-of-view; and an imaging system which images the two-dimensional spectral field-of-view onto a detector; wherein the imaging system comprises primary, secondary, and tertiary tilted mirrors, where each of the tilted mirrors comprises a freeform, rotationally non-symmetric surface shape.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.