Method and measurement system for determining foreign gases in ethylene
US11169087B2 · kind B2 · utility
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6References
36Claims
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Key dates
| Filing date | Jul 21, 2017 |
| Grant date | Nov 9, 2021 |
| Priority date | — |
| Expiry date | Jul 21, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/06113
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method and system in which, in order to determine foreign gases in ethylene with a degree of purity up to greater than 99%, a sample 2 of the ethylene in a measuring cell 1 is irradiated with light 14, wherein the wavelength of the light 14 is varied to scan selected absorption lines of the foreign gases in a wavelength-dependent manner, where the light 14 is detected after passing through the sample 2 to determine the concentrations of the foreign gases based on the wavelength-specific absorption of the light 14 at the points of the scanned absorption lines.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.