Surface inspection system and method using multiple light sources and a camera offset therefrom
US11169095B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 29, 2017 |
| Grant date | Nov 9, 2021 |
| Priority date | — |
| Expiry date | Oct 24, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8905
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A surface inspection system for inspecting the surface of sheet elements present in an inspection area: The system includes two light sources arranged adjacent each other on opposite sides of an illumination plane, and a camera for capturing line images of the inspection area along a viewing plane. The illumination plane and the viewing plane are arranged on opposite sides of a median plane perpendicular to an inspection plane. The angle between the illumination plane and the median plane is the same as the angle between the viewing plane and the median plane. In a method of using the system, the first light source illuminates the sheet element before the second light sources does. An image evaluation unit compares the captured line images with each other.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.