System and method for calibrating inspection of a feature on a part
US11169129B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Feb 18, 2020 |
| Grant date | Nov 9, 2021 |
| Priority date | — |
| Expiry date | Feb 18, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and systems for calibrating inspection of a feature on a part are described. The method comprises acquiring, at a plurality of point cloud densities, measurement data from a reference part having a known defect associated with the feature; assessing the measurement data at the plurality of point cloud densities to detect the known defect; determining a lowest point cloud density from the plurality of point cloud densities at which the known defect is detectable; and setting an inspection point cloud density for inspection of the feature to the lowest point cloud density.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.