Determining a configuration of a test system
US11169203B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 26, 2018 |
| Grant date | Nov 9, 2021 |
| Priority date | — |
| Expiry date | Feb 6, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q10/06315
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Example systems for determining a configuration of a test system execute operations that include receiving first parameters specifying at least part of an operation of a test system; receiving second parameters specifying at least part of a first configuration of the test system; determining a second configuration of the test system based, at least in part, on the first parameters and the second parameters, with the second configuration being determined to impact a cost of test of the test system; generating, by one or more processing devices, data for a graphical user interface representing information about the second configuration and the cost of test; and outputting the data for the graphical user interface for rendering on a display device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.