Hall element signal calibrating in angle sensor

US11169223B2 · kind B2 · utility

Assignee

• Allegro MicroSystems, LLC · US

Inventors

• Till-Jonas Ostermann · Hirschberg, DE
• Dominik Geisler · Heidelberg, DE
• Simon E. Rock · Heidelberg, DE
• Fabian Winkler · Heidelberg, DE

Key dates

• Filing date: Mar 23, 2020
• Grant date: Nov 9, 2021
• Expiry date: May 19, 2040

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R33/072
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

In one aspect, an angle sensor includes a first Hall element disposed on a first axis, a second Hall element disposed on a second axis perpendicular to the first axis and a conduction path having a first portion extending parallel to the first axis and a second portion parallel to the second axis. The conduction path is configured to conduct a calibration current that generates a first magnetic flux density measured at the first Hall element and a second magnetic flux density measured at the second Hall element. The angle sensor also includes calibration circuitry configured to generate one or more compensation signals based on the first and second magnetic flux densities and to adjust an external magnetic flux density measured at the second Hall element due to an external magnetic field using the one or more compensation signals to reduce angle error of the angle sensor.