Methods of calibrating semiconductor radiation detectors using K-edge filters
US11169286B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 9, 2018 |
| Grant date | Nov 9, 2021 |
| Priority date | — |
| Expiry date | Nov 19, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/24
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A set of N standard bin count distributions may be generated by irradiating a test radiation detector system with an X-ray beam attenuated by a respective one of N different K-edge filters for each of the at least one X-ray source energy setting. Energy bins of detectors of a target radiation detector system may be calibrated by generating measured bin count distributions for each calibration setting in which a respective one of the N different K-edge filters attenuates a source X-ray beam. Calibration parameters of the detectors of the target radiation detector system may be adjusted to match each of the measured bin count distributions to a corresponding standard bin count distribution. In addition, energy resolution of the radiation detectors can be measured and calibrated by fitting a portion of the measured X-ray spectrum near a K-edge to a fitting function.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.