Collecting samples hierarchically in a datacenter
US11171849B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 30, 2019 |
| Grant date | Nov 9, 2021 |
| Priority date | — |
| Expiry date | Oct 30, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/87
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
Some embodiments of the invention provide a method for collecting metric values relating to operations of a set of one or more resources executing on host computers in a datacenter. In some embodiments, the method hierarchically collects and analyzes samples, with a first set of samples collected and analyzed in the data plane, and a second set of samples collected and analyzed in the control plane by aggregating the samples collected in the data plane. In some embodiments, the data plane includes host computers on which sample collecting engines (e.g., service engines) execute, while the control plane includes a set of one or more servers that obtains sample data collected by the host computers, and aggregates and analyzes this data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.