Measuring system for validating a preconfigured target attribute
US11175137B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 5, 2019 |
| Grant date | Nov 16, 2021 |
| Priority date | — |
| Expiry date | Dec 5, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/73
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measuring system comprising a measuring instrument and a computer system, the measuring instrument comprising a base unit, a support unit mounted on the base unit, a targeting unit comprising a distance meter having a targeting axis, a first angle encoder configured for measuring a horizontal angular position of the support unit, a second angle encoder for measuring a vertical angular position of the targeting unit, a camera for capturing image data, and a control unit is configured for computing a position of a target based on a preconfigured target attribute, the computer system being configured for receiving the image data from the camera, executing a classifier for determining at least one of a plurality of classes of at least part of the image data, validating a preconfigured target attribute based on the at least one class target attribute, and generating result data based on the validation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.