Applying approximate measure values from dissimilar maps
US11176182B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 13, 2020 |
| Grant date | Nov 16, 2021 |
| Priority date | — |
| Expiry date | Jun 24, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F16/909
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method including: receiving a base map that is divided into geographical base regions, each of the geographical base regions having a measure of a first parameter; receiving a plurality of secondary maps that are each divided into a plurality of geographical regions, each of the geographical regions having a measure of a secondary parameter; determining a total overlap percentage for each of the secondary maps relative to the base map, the total overlap percentage for one of the secondary maps being an average of overlap percentages of each of the geographical regions of the one of the secondary maps with the geographical base regions of the base map; receiving a selection of one of the secondary maps; and applying the secondary parameter of the selected secondary map to each of the geographical base regions of the base map.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.