Patent · US Active

Model optimization and data analysis using machine learning techniques

US11176444B2 · kind B2 · utility

6Cited by

20References

16Claims

0Family size

Assignee

Cognoa, Inc. · US

Inventors

Dennis Wall · Palo Alto, US
Sharief Khalil TARAMAN · Laguna Niguel, US
Brent Vaughan · Portola Valley, US
Abdelhalim Abbas · San Jose, US

Key dates

Filing date	Nov 3, 2020
Grant date	Nov 16, 2021
Priority date	—
Expiry date	Nov 3, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG06F18/217
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Disclosed herein are platforms, systems, devices, methods and media for model optimization and data analysis using machine learning. Input data can be processed and analyzed to identify relevant discriminating features, which can be modeled using a plurality of machine learning models. A computing device can be configured with one or more optimized models for categorizing input data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.