Automated implant movement analysis systems and related methods
US11176683B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 27, 2020 |
| Grant date | Nov 16, 2021 |
| Priority date | — |
| Expiry date | May 1, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/03
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods, systems, workstations, and computer program products that provide automated implant analysis using first and second sets of patient image stacks of a patient having at least one metallic implant coupled to bone. Relevant image stack pairs are selected from the first and second patient image stacks, the image stack pairs having at least one common target object or part of a target object for analysis therein. Bone and the at least one metallic implant are segmented in the first and second image stacks to define segmented objects and/or segmented parts of objects. Selected relevant image stack pairs from the first and second patient image stacks can be registered using the selected segmented objects and/or the segmented parts of objects. Measurements of movement of the implant and/or coupled bone after the registration can be calculated using the selected segmented objects and/or the segmented parts of objects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.