Calibration verification for optical particle analyzers
US11181455B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 8, 2019 |
| Grant date | Nov 23, 2021 |
| Priority date | — |
| Expiry date | Dec 31, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S3/0007
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer. The method includes the steps of providing an optical particle analyzer and modulating a power applied to a source of EMR. The method includes the steps of, in response to the modulating step, inducing a detector signal waveform and analyzing the detector signal waveform to determine a value of at least one diagnostic parameter associated with one or more of the source of EMR, an optical assembly, a chamber, a detector, and an optical collection system of the optical particle analyzer. The method includes the step of determining a calibration status of the optical particle analyzer based on the one or more determined values of the at least one diagnostic parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.