Signal generation device, spectrum analyzing device and corresponding methods with correction parameter
US11184091B2 · kind B2 · utility
0Cited by
6References
17Claims
0Family size
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Inventor
Key dates
| Filing date | Mar 29, 2018 |
| Grant date | Nov 23, 2021 |
| Priority date | — |
| Expiry date | Mar 29, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/29
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A signal generation device with correction parameter measurement is provided. Said signal generation device comprises a signal generating unit configured to provide at least one test signal for a device under test with the aid of a connection structure, and a correction parameter measurement unit configured to measure at least one correction parameter with respect to said connection structure. In this context, both the signal generating unit and the correction parameter measurement unit are integrated into one housing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.