Patent · US Active

Micro-spectrometry measurement method and system

US11187581B2 · kind B2 · utility

0Cited by
3References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 23, 2018
Grant dateNov 30, 2021
Priority date
Expiry dateJan 23, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B21/367
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Disclosed is an optical micro-spectrometry system including an optical microscope, a spectrometry system and an optical system adapted to direct an excitation light beam on the sample through the at least one microscope objective and to collect a Raman or PL light beam from a sample. The optical micro-spectrometry system includes an imaging system configured for acquiring a first image and a second image of the sample, by reflection or transmission of an illumination beam from a sample surface, the first image having a large field of view and the second image having a small field of view, a processing system configured for determining an area in the first image corresponding to the second image, a display system configured for displaying the first image, the second image, and a third image representing the area in overlay on the first image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.