Patent · US Active

Method of setting an analyzer for testing a device under test

US11187736B2 · kind B2 · utility

0Cited by

2References

23Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Werner Held · Pöcking, DE
Jan-Patrick Schultheis · Munich, DE

Key dates

Filing date	Feb 20, 2020
Grant date	Nov 30, 2021
Priority date	—
Expiry date	Apr 4, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG01R27/32
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method of setting an analyzer, the method comprising: providing an analyzer with a first signal source and a second signal source; connecting the signal sources with a device under test; generating a first signal, transmitting the first signal to the device under test, measuring the first transmitted signal and a first signal reflected from the device under test, thereby obtaining first compensation parameters; generating a second signal, transmitting the second signal to the device under test, measuring the second transmitted signal and a second signal reflected from the device under test, thereby obtaining second compensation parameters; using the first and second compensation parameters to compensate the signal sources; and transmitting the first and second signals simultaneously.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.