Patent · US Active

System and method for calibrating radio frequency test chambers

US11187737B2 · kind B2 · utility

1Cited by

6References

14Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Alexander Nähring · Munich, DE
Meik Kottkamp · Munich, DE
Markus Herbrig · Grafing, DE
Aytac Kurt · Munich, DE

Key dates

Filing date	Aug 6, 2019
Grant date	Nov 30, 2021
Priority date	—
Expiry date	Aug 6, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG01R35/005
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system for calibrating radio frequency test chambers is provided. The system comprises an antenna array with a plurality of antenna elements arranged in a three dimensional configuration, a plurality of power measuring units downstream to the plurality of antenna elements and a processing unit. In this context, the plurality of power measuring units output a power from each antenna elements corresponds to a radiation pattern generated by an incident test signal. The processing unit is configured to analyze the power distribution of the test signal in order to calculate a calibration.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.