Verification of software test quality using hidden variables
US11188453B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 15, 2020 |
| Grant date | Nov 30, 2021 |
| Priority date | — |
| Expiry date | Dec 15, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3698
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and related method comprise using a processor for executing a plurality of tests associated with a covering array of a test framework of the software test system on a first version of a system under test (SUT). For each of the plurality of tests, on a current test, the method comprises determining a current success rate value (SRV) for the current test that represents a success rate of the current test for the first version of the SUT. The method further comprises combining the current SRV of the first version of the SUT and current SRVs of the current test for prior versions of the SUT into a current test eigenvector associated with the current test. The method further comprises converting the current test eigenvector into a first eigenvalue that represents a health, accuracy, and quality of the first version of the SUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.