Metrics store system
US11188550B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 31, 2016 |
| Grant date | Nov 30, 2021 |
| Priority date | — |
| Expiry date | Sep 2, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2200/24
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The disclosed embodiments include a method performed by a data intake and query system. The method includes ingesting each metric including at least one key value and a measured value taken of a computing resource, and storing each metric in an index of a metrics store, where the index defines at least one dimension populated with the at least one key value and a measure populated with the measured value. The method further includes cataloging metadata in a metrics catalog, where the metadata is related to the metrics stored in the metrics store, performing an analysis of metrics data included in the metrics store and/or the metrics catalog to obtain results, and causing display of the results or an indication of the results on a display device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.