Defect detection using multiple models
US11188792B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 7, 2020 |
| Grant date | Nov 30, 2021 |
| Priority date | — |
| Expiry date | Jul 19, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for generating training models includes generating a preliminary training model based on a group of first images, the first images including different types of objects; processing a group of second images with the preliminary model to generate a probability array for each of the second images, the probability array indicating likelihoods that an object is a particular type of object; generating correlations between the different types of objects based on the probability arrays; generating a plurality of object groups based on the correlations, where each object group includes a plurality of different types of objects that have a relatively low correlation with the other types of objects in the same object group; and for each object group, generating a final training model based on a group of third images, the third images each including an object having an object type corresponding to one of the object types.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.