Patent · US Active

Assisted analytics

US11188865B2 · kind B2 · utility

4Cited by
13References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 12, 2019
Grant dateNov 30, 2021
Priority date
Expiry dateNov 29, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F16/24578
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Assisted analytics, facilitates responding to a user selection of a measure that is calculated from a data set that is characterized by a plurality of dimensions of data, populating, with a processor a set of dimensions of the data with dimensions that contribute at least one data value to the user selected measure by calculating, for each dimension of the data in the set of dimensions of data a measure outlier threshold for a set of timeframe-specific values of the measure. This outlier threshold is applied, for each dimension of the data in the set of dimensions of data to calculate a dimension-specific outlier factor by aggregating timeframe-specific outlier weights for each timeframe in which a timeframe-specific value in the set of timeframe-specific values exceeds the measure outlier threshold. The results of this aggregation can be displayed in a ranked list of dimensions based on the dimension-specific outlier factor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.