Patent · US Active

Arrangement having a coordinate measuring machine or microscope

US11189012B2 · kind B2 · utility

1Cited by

0References

19Claims

0Family size

Assignee

Carl Zeiss Industrielle Messtechnik GmbH · DE

Inventors

Patrick Betz · Heubach, DE
Oliver Unrath · Königsbronn, DE
Markus Ritter · Adliswil, CH

Key dates

Filing date	Jan 29, 2020
Grant date	Nov 30, 2021
Priority date	—
Expiry date	May 13, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/10056
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method includes generating image signals from which a two-dimensional image is generated. The method includes generating object image signals by capturing an examination object arranged in a space. The method includes generating overview image signals by capturing an overview of the space. The method includes receiving image information included in the generated object image signals and the generated overview image signals. The method includes combining a two-dimensional object image, generated from the object image signals, with a two-dimensional perspectively distorted overview image of the space, generated from the overview image signals, to form a two-dimensional output image. The method includes scaling the received image information with respect to an image size for forming the output image in a manner such that at least one dimension of the examination object captured both in the object image and in the overview image has a same size in the output image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.