Measurement system
US11193803B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 30, 2019 |
| Grant date | Dec 7, 2021 |
| Priority date | — |
| Expiry date | Sep 21, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Various examples are directed to systems and methods for managing a sensor. A measurement system may receive, from a host device, a first register map describing a first configuration of a measurement system. The first configuration may be associated with a first sensor. The measurement system may compare the first register map to an error rule set indicating inconsistent register map arrangements. After comparing the first register map to the error rule set, the measurement system may configure a switch matrix of the measurement system to sample the first sensor according to the first configuration of the measurement system. The measurement system may receive a plurality of samples from a first sensor and generate first digital measurement data based at least in part on the plurality of samples.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.