Patent · US Active

Method of estimating a condition parameter of a laser diode with an associated photodiode, apparatus for monitoring the operation of such laser diode and particular sensor apparatus

US11193870B2 · kind B2 · utility

1Cited by

2References

11Claims

0Family size

Assignees

Robert Bosch GmbH · DE
TRUMPF PHOTONIC COMPONENTS GMBH · DE

Inventors

Robert Wolf · Dresden, DE
Soren Sofke · Reutlingen, DE
Philipp Henning Gerlach · Ulm, DE
Susanne Weidenfeld · Weilheim, DE

Key dates

Filing date	Jul 30, 2019
Grant date	Dec 7, 2021
Priority date	—
Expiry date	Aug 15, 2039

Classification

Technology area (CPC H)Electricity
CPC primaryH01S5/4025
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The present invention provides a method for estimating a condition parameter of a laser diode having an associated photodiode, to an apparatus for monitoring the operation of such a laser diode, and to a particle sensor apparatus. The photodiode (PD) is operable together with the laser diode (LD), wherein it detects the light (LS) of the laser diode (LD) and converts it into an electrical current, and is thermally coupled to the laser diode (LD). The at least one condition parameter is estimated during the operation of the laser diode (LD) and the estimation is based on current measurements and/or voltage measurements at the laser diode (LD) and/or at the photodiode (PD).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.