Patent · US Active

System for vector network analysis of a device under test as well as method for vector network analysis of a device under test

US11193965B2 · kind B2 · utility

1Cited by

7References

19Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Korbinian Pfaffeneder · Munich, DE
Georg Schnattinger · Dorfen, DE
Marcel Thraenhardt · Munich, DE
Michael Katzer · Munich, DE

Key dates

Filing date	May 29, 2018
Grant date	Dec 7, 2021
Priority date	—
Expiry date	Feb 18, 2039

Classification

Technology area (CPC H)Electricity
CPC primaryH04B17/309
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system for vector network analysis of a device under test, comprising at least two measurement receivers, at least one signal generator device formed separately from the at least two measurement receivers, and at least one data processing unit connected with the measurement receivers. The connection between the data processing unit and at least one of the measurement receivers is flexible so that the position of the measurement receiver is adjustable. Further, a method for vector network analysis of a device under test is described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.