Storing charge associated with electrical overstress
US11193967B2 · kind B2 · utility
2Cited by
66References
33Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 15, 2020 |
| Grant date | Dec 7, 2021 |
| Priority date | — |
| Expiry date | Jan 15, 2040 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02T10/7072
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.