Systems and methods for characterizing object pose detection and measurement systems
US11195303B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 3, 2020 |
| Grant date | Dec 7, 2021 |
| Priority date | — |
| Expiry date | Dec 3, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2219/2004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for characterizing a pose estimation system includes: receiving, from a pose estimation system, first poses of an arrangement of objects in a first scene; receiving, from the pose estimation system, second poses of the arrangement of objects in a second scene, the second scene being a rigid transformation of the arrangement of objects of the first scene with respect to the pose estimation system; computing a coarse scene transformation between the first scene and the second scene; matching corresponding poses between the first poses and the second poses; computing a refined scene transformation between the first scene and the second scene based on coarse scene transformation, the first poses, and the second poses; transforming the first poses based on the refined scene transformation to compute transformed first poses; and computing an average rotation error and an average translation error of the pose estimation system based on differences between the transformed first poses and the second poses.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.