Display device and inspecting method therefor
US11195440B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 23, 2018 |
| Grant date | Dec 7, 2021 |
| Priority date | — |
| Expiry date | Sep 4, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2330/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A display device includes a defect inspection circuit, and a display panel having a display area and a peripheral area positioned outside the display area. The display panel includes a sensing wire positioned in the peripheral area and connected to the defect inspection circuit. The defect inspection circuit includes a resistance detection circuit that detects a resistance of the sensing wire based on an output signal corresponding to the sensing wire, a memory that stores first resistance information related to the resistance of the sensing wire detected in a first inspection operation, and a comparator circuit including a first comparator that compares the first resistance information with second resistance information. The second resistance information is related to the resistance of the sensing wire detected in a second inspection operation that is performed at a different time than the first inspection operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.