Apparatus for measuring spectrum, method of correcting temperature change of light source in spectrum, and apparatus and method for estimating analyte concentration
US11199492B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 13, 2019 |
| Grant date | Dec 14, 2021 |
| Priority date | — |
| Expiry date | Mar 27, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/1211
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring a spectrum includes a light source array configured to emit light towards an object, a photodetector configured to detect light reflected by the object; and a processor configured to measure, using the light source array and the photodetector, a plurality of temperature correction spectra based on a temperature change of the light source array, obtain a light source temperature drift vector by analyzing the measured plurality of temperature correction spectra, measure, using the light source array and the photodetector, an analysis spectrum by using the light source array and the photodetector, and adjust the measured analysis spectrum to reduce an effect of the temperature change of the light source array by using the obtained light source temperature drift vector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.