Cluster model to predict build failure
US11200377B2 · kind B2 · utility
1Cited by
5References
19Claims
0Family size
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Key dates
| Filing date | Apr 27, 2017 |
| Grant date | Dec 14, 2021 |
| Priority date | — |
| Expiry date | Sep 20, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N5/041
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Techniques to create and use cluster models to predict build failures are provided. In one aspect, clusters in a set of builds may be identified. The identified clusters may be used to create a model. The model may be used to predict causes of build failures. In another aspect, a failed build may be identified. A clustering model may be retrieved. A cause of problems with the failed build may be predicted using the clustering model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.