Patent · US Active

Infrared camera ambient temperature calibration systems and methods

US11200697B2 · kind B2 · utility

0Cited by

3References

20Claims

0Family size

Assignee

FLIR Systems AB · SE

Inventors

Jonas Sandsten · Lomma, SE
Per Lilja · Åkersberga, SE
Henning Hagman · Täby, SE
Marta Barenthin-Syberg · Stockholm, SE
Tien Nguyen · Wilsonville, US

Key dates

Filing date	Dec 11, 2019
Grant date	Dec 14, 2021
Priority date	—
Expiry date	Dec 11, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/10048
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

An ambient temperature calibration process includes, in accordance with an embodiment, determining an ambient temperature calibration value for a global external resistance associated with a read out integrated circuit (ROIC) of an image capture component comprising a sensor array comprising a focal plane array of microbolometers arranged on the ROIC; determining an ambient temperature calibration value for a sensor integration time associated with the ROIC; and determining an ambient temperature calibration mapping for an offset mapping associated with the ROIC.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.