Patent · US Active

Magnetic particle imaging

US11204398B2 · kind B2 · utility

0Cited by
33References
7Claims
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Key dates

Filing dateJul 12, 2017
Grant dateDec 21, 2021
Priority date
Expiry dateAug 20, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R33/10
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A Magnetic Particle Imaging (MPI) system with a magnet configured to generate a magnetic field with a field free line, the magnet integrated with a flux return designed so that a flux path at approximately the center of the field-free line has a first reluctance and a second flux path distal from the center of the field-free line has a second reluctance, and the second reluctance is lower than the first reluctance to facilitate a high fidelity magnetic field and high fidelity field free line.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.