Machine learning model monitoring
US11204847B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 21, 2018 |
| Grant date | Dec 21, 2021 |
| Priority date | — |
| Expiry date | Apr 1, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/20
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Technologies for monitoring performance of a machine learning model include receiving, by an unsupervised anomaly detection function, digital time series data for a feature metric; where the feature metric is computed for a feature that is extracted from an online system over a time interval; where the machine learning model is to produce model output that relates to one or more users' use of the online system; using the unsupervised anomaly detection function, detecting anomalies in the digital time series data; labeling a subset of the detected anomalies in response to a deviation of a time-series prediction model from a predicted baseline model exceeding a predicted deviation criterion; creating digital output that identifies the feature as associated with the labeled subset of the detected anomalies; causing, in response to the digital output, a modification of the machine learning model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.