Optical and functional metrology of microstructured optical fibers
US11209338B1 · kind B1 · utility
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20Claims
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Key dates
| Filing date | Oct 7, 2020 |
| Grant date | Dec 28, 2021 |
| Priority date | — |
| Expiry date | Oct 7, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B6/02295
- WIPO fieldOther special machines
- WIPO sectorMechanical engineering
Abstract
Described are systems and techniques for characterizing optical fibers. Disclosed systems and techniques employ optical metrology, functional metrology, or both to characterize microstructured optical fibers and determine fiber characteristics, errors, and quality control metrics. The characteristics, errors, and quality control metrics are useful for improving the manufacturing of optical fibers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.