High-dimensional image feature matching method and device
US11210555B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 28, 2017 |
| Grant date | Dec 28, 2021 |
| Priority date | — |
| Expiry date | May 20, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/763
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A high-dimensional image feature matching method and device relating to the field of image retrieval. The method includes extracting a high-dimensional image feature of an image to be retrieved; dividing the high-dimensional image feature of the image to be retrieved into a plurality of low-dimensional image features; comparing each of the low-dimensional image features of the image to be retrieved with clustering centers at each layer of the low-dimensional image features of the images in a database; and determining a similarity the low-dimensional image feature between the image to be retrieved and each of some images in the database according to a comparison result, so that at least one feature matching the high-dimensional image feature of the image to be retrieved is retrieved in the database.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.