Patent · US Active

Computer-implemented method for locating possible artifacts in a virtually stained histology image

US11210791B2 · kind B2 · utility

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15Claims

0Family size

Assignee

Carl Zeiss Meditec AG · DE

Inventors

Stefan Saur · Aalen, DE
Christoph Hauger · Aalen, DE
Gerald Panitz · Bopfingen, DE

Key dates

Filing date	Mar 1, 2021
Grant date	Dec 28, 2021
Priority date	—
Expiry date	Mar 1, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/30024
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A computer-implemented method for locating possible artifacts in a virtually stained histology image, which was obtained from an initial histology image, is provided. In the method, at least one further image is generated on the basis of the virtually stained histology image or the initial histology image. The differences between the at least one further image and the virtually stained histology image are determined when the at least one further image has been generated on the basis of the initial histology image or the differences between the at least one further image and the initial histology image are determined when the at least one further image has been generated on the basis of the virtually stained histology image, and a mapping from the determined differences to their positions in the virtually stained histology image is created. The positions in the virtually stained histology image represent the positions of possible artifacts.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.