Patent · US Active

Antimicrobial particle detectors

US11215546B2 · kind B2 · utility

14Cited by
64References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 6, 2020
Grant dateJan 4, 2022
Priority date
Expiry dateOct 6, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/022
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention generally provides systems and methods for particle detection for minimizing microbial growth and cross-contamination in manufacturing environments requiring low levels of microbes, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. In some embodiments, systems of the invention incorporate a housing having an outer surface being a first antimicrobial surface and a touchscreen being a second antimicrobial surface. In some embodiments, substantially all of the outer surfaces of the system are antimicrobial surfaces. In some embodiments, the first antimicrobial surface may comprise an Active Screen Plasma alloyed layer. In some embodiments, the housing may comprise a molded polymer substrate and a metal coating layer bonded to the molded polymer substrate such that at least some exterior surfaces of the housing are metal coated surfaces.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.