Patent · US Active

Gate system for sample detection and method of sample inspection

US11215626B2 · kind B2 · utility

0Cited by
8References
9Claims
0Family size

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Key dates

Filing dateMay 8, 2019
Grant dateJan 4, 2022
Priority date
Expiry dateAug 11, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2035/1048
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present disclosure provides a gate system for sample detection and a method of sample inspection, which relate to the field of detection and analysis technology. The gate system comprises: an accommodating apparatus configured to accommodate an inserted ticket to be detected; a wipe sampling apparatus including a wipe sampling belt which is configured to drive the ticket to be detected to move within the accommodating apparatus and to conduct a wipe sampling to the ticket; an inspiratory sampling apparatus configured to collect samples dropped from the wipe sampling apparatus; and a detection apparatus configured to detect the samples and output detection results. The gate system for sample detection and the method of sample inspection provided by the present disclosure have a wide range of applications and can perform rapid sampling and detection to those substances that are difficult to be volatilized.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.