Probe card assembly in automated test equipment
US11215641B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 24, 2019 |
| Grant date | Jan 4, 2022 |
| Priority date | — |
| Expiry date | Jun 15, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2834
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Probe pin arrangements in a vertical-type probe card assembly for an automated test equipment (ATE) are disclosed. In some embodiments, one or more additional conductive regions are provided in between adjacent probe pins. The additional conductive regions may reduce spacing between probe pins connected to adjacent probe card pads, and may in turn reduce or adjust inductance between the two probe cards pads to provide improved signal impedance matching or lower power impedance. In one embodiment, the additional conductive region is a short probe pin. In another embodiment, the additional conductive region is a protrusion on a vertical probe pin.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.