Gauge length effect and gauge length conversion
US11215727B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 18, 2017 |
| Grant date | Jan 4, 2022 |
| Priority date | — |
| Expiry date | Sep 2, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2210/324
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Various embodiments include apparatus and methods implemented to take into consideration gauge length in optical measurements. In an embodiment, systems and methods are implemented to interrogate an optical fiber disposed in a wellbore, where the optical fiber is subjected to seismic waves, and to generate a seismic wavefield free of gauge length effect and/or to generate a prediction of a seismic wavefield of arbitrary gauge length, based on attenuation factors of a plurality of wavefields acquired from interrogating the optical fiber. In an embodiment, systems and methods are implemented to interrogate an optical fiber disposed in a wellbore, where the optical fiber is subjected to seismic waves, and to convert a seismic wavefield associated with a first gauge length to a seismic wavefield associated with a different gauge length that is a multiple of the first gauge length. Additional apparatus, systems, and methods are disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.