Calibrating an interface board
US11221365B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 11, 2020 |
| Grant date | Jan 11, 2022 |
| Priority date | — |
| Expiry date | Oct 1, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31905
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An example test system includes a device interface board (DIB) having one or more signal transmission paths and an interface for connecting to one or more other components of the test system. Test circuitry is configured to inject test signals into the one or more signal transmission paths and to measure transmitted versions of the test signals at the interface to obtain measurement signals. One or more processing devices are configured to generate calibration factors based on differences between the injected test signals and the measurement signals, and to store the calibration factors in computer memory. The calibration factors are for correcting for effects on the test signals of the one or more signal transmission paths.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.