Targeted testing and machine-learning systems for detecting and identifying machine behavior
US11222202B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 14, 2019 |
| Grant date | Jan 11, 2022 |
| Priority date | — |
| Expiry date | Apr 3, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2218/16
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods are described for identifying a behavior of a machine. A computer system receives a signal indicative of operation of a field machine and applies a deep learning algorithm to identify a pattern in a collection of signals stored on a computer-readable memory. The collection of signals includes the received signal indicative of operation of the field machine and other signals. A series of targeted tests are performed using a test machine while monitoring a signal indicative of operation of the test machine. A behavior is identified during the series of targeted tests that produces a signal that matches the pattern identified by the deep learning algorithm. An occurrence of the behavior is then automatically identified in the field machine in response to detecting the pattern in the received signal indicative of operation of the field machine.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.