Feature selection method, device and apparatus for constructing machine learning model
US11222285B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 29, 2021 |
| Grant date | Jan 11, 2022 |
| Priority date | — |
| Expiry date | Jan 29, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/20
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A feature-selection system obtains a training data set and associated features; divides the training data set into a first number of training data subsets; and forms a plurality of feature-selecting data sets. A feature-selecting data set comprises a second number of training data subsets. The system processes, in parallel, each feature-selecting data set, which comprises: computing a first evaluation index for the features based on the feature-selecting data set; obtaining a group of index ranks corresponding to the features based on the first evaluation index; and obtaining a group of importance ranks corresponding to the features based on the feature-selecting data set and a machine-learning model. The system further obtains a group of total ranks by fusing groups of index ranks and groups importance ranks obtained from processing the plurality of feature-selecting data sets; and selecting target features from the features based on the group of total ranks.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.