X-ray imaging system and method of x-ray imaging
US11226298B2 · kind B2 · utility
3Cited by
6References
11Claims
0Family size
Assignee
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Key dates
| Filing date | Sep 27, 2019 |
| Grant date | Jan 18, 2022 |
| Priority date | — |
| Expiry date | Jan 13, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/045
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An x-ray imaging system includes an x-ray source configured to emit x-ray radiation towards a sample, and a primary detector configured to detect x-ray radiation from the x-ray source passing through the sample. The x-ray imaging system also includes a secondary detector configured to detect x-ray radiation from the x-ray source scattered in the sample, and imaging optics configured to guide x-ray radiation scattered in the sample onto the secondary detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.