Eliminating source lamp intensity drift effect using reference measurement between cuvettes
US11226346B2 · kind B2 · utility
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5References
14Claims
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Key dates
| Filing date | Jul 19, 2017 |
| Grant date | Jan 18, 2022 |
| Priority date | — |
| Expiry date | Sep 11, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/12715
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A computer-implemented method for calibrating a photometer in an in-vitro diagnostics analyzer includes generating a cuvette map of a reaction ring identifying a plurality of cuvette locations. The cuvette map is used to identify a plurality of reference measurement areas between the plurality of cuvette locations. A plurality of reference measurements are acquired in the reference measurement areas using the photometer. The photometer is automatically calibrated based on a comparison of the reference measurements to a predetermined standard setup of the photometer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.