Portable chip tester with integrated field programmable gate array

US11226372B2 · kind B2 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Noah Singer · White Plains, US
• Daniele Di Genova · Hopewell Junction, US
• Andrew A. Turner · Colchester, US
• John G. Torok · Poughkeepsie, US
• Gary W. Maier · Roberts, US
• Richard W. Oldrey · Clintondale, US

Key dates

• Filing date: Oct 9, 2019
• Grant date: Jan 18, 2022
• Expiry date: Mar 25, 2040

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/318519
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Aspects of the invention include systems and methods directed to a portable chip tester. A non-limiting example of a system includes a housing, a printed circuit board mounted on the housing, in which the printed circuit board includes a first interface operable to permit electrical communication between the printed circuit board and a device under test. The system further includes a mount operable to enable an electrical connection with an integrated circuit, in which the integrated circuit is operable to manage testing the device under test under a testing protocol. The system further includes a power supply and a software platform that includes a memory having computer readable instructions and one or more processors for executing the computer readable instructions. The computer readable instructions controlling the processors to perform operations including directing the integrated circuit to manage testing of the device under test pursuant to the testing protocol.