Methods for repairing gate-line disconnection and short circuit between gate line and data gate and repair structure
US11226525B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Oct 25, 2019 |
| Grant date | Jan 18, 2022 |
| Priority date | — |
| Expiry date | Oct 25, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F2201/121
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A method for repairing the gate-line disconnection includes: determining a disconnected position of a gate line; determining two connecting elements that are closest to the disconnected position and are respectively located at two sides of the disconnected position along an extending direction of the gate line; selecting one or two sub-pixels electrically connected to the two connecting elements as repair sub-pixels, determining a common electrode line coupled to a common electrode of each repair sub-pixel as a selected common electrode line; forming a communication path between a front portion and a rear portion at the disconnected position to bypass the disconnected position, the communication path including at least the common electrode of each repair sub-pixel and a separate line segment cut from the selected common electrode line; disconnecting the common electrode in the communication path from other common electrodes; and disconnecting each repair sub-pixel from a data line.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.