Automated generation of metrics from log data
US11226964B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 28, 2018 |
| Grant date | Jan 18, 2022 |
| Priority date | — |
| Expiry date | Dec 2, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F16/2379
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A log-to-metrics transformation system includes a log-to-metrics application executing on a processor. The log-to-metrics transformation system receives a format associated with machine data, and further receives, via a first graphical control, a first set of metric identifiers corresponding to a first set of metrics associated with the machine data. The log-to-metrics transformation system generates a first set of mappings between the first set of metric identifiers and a first set of field values included in the machine data. The log-to-metrics transformation system stores the first set of mappings and an association with the format of the machine data. The log-to-metrics transformation system, based on the first set of mappings, causes the first set of field values to be extracted from the machine data. Further, a first metric included in the first set of metrics is determined based on at least a portion of the first set of field values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.